• DocumentCode
    795635
  • Title

    Improved model-order reduction by using spacial information in moments

  • Author

    Ismail, Yehea I.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Northwestern Univ., Evanston, IL, USA
  • Volume
    11
  • Issue
    5
  • fYear
    2003
  • Firstpage
    900
  • Lastpage
    908
  • Abstract
    The new concept of multinode moment matching (MMM) is introduced in this paper. The MMM technique simultaneously matches the moments at several nodes of a circuit using explicit moment matching around s=0. As compared to the well known single-point moment matching (SMM) techniques (such as asymptotic waveform evaluation), MMM has several advantages. First, the number of moments required by MMM is significantly lower than SMM for a reduced-order model of the same accuracy, which directly translates into computational efficiency. This higher computational efficiency of MMM as compared to SMM increases with the number of inputs to the circuit. Second, MMM has much better numerical stability as compared to SMM. This characteristic allows MMM to calculate an arbitrarily high-order approximation of a linear system, achieving the required accuracy for systems with complex responses. Finally, MMM is highly suitable for parallel-processing techniques especially for higher order approximations while SMM has to calculate the moments sequentially and cannot be adapted to parallel processing techniques.
  • Keywords
    circuit simulation; linear network analysis; method of moments; numerical stability; parallel processing; reduced order systems; computational efficiency; linear circuit simulation; model-order reduction; multinode moment matching; numerical stability; parallel processing; spatial information; Circuit simulation; Computational efficiency; Integrated circuit interconnections; Linear approximation; Linear systems; Numerical stability; Parallel processing; RLC circuits; Reduced order systems; Transfer functions;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2003.817138
  • Filename
    1234409