• DocumentCode
    795724
  • Title

    Improved four-port instrument using two power detectors to measure complex reflection coefficients of microwave devices

  • Author

    Yeo, S.P. ; Cheng, M.

  • Author_Institution
    Dept. of Electr. Eng., Nat. Univ. of Singapore, Singapore
  • Volume
    32
  • Issue
    6
  • fYear
    1996
  • fDate
    3/14/1996 12:00:00 AM
  • Firstpage
    565
  • Lastpage
    566
  • Abstract
    An improved prototype of the multi-state four port reflectometer (which uses only two power detectors) is used for measuring the complex reflection coefficients of microwave devices. Laboratory tests indicate that the measurement uncertainties for the proposed instrument are within ±0.01 for magnitude and ±1.5° for phase
  • Keywords
    calibration; microwave devices; microwave reflectometry; power measurement; reflectometers; complex reflection coefficients; four-port instrument; microwave devices; power detectors; reflectometer;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19960385
  • Filename
    490476
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=795724