Title :
Improved four-port instrument using two power detectors to measure complex reflection coefficients of microwave devices
Author :
Yeo, S.P. ; Cheng, M.
Author_Institution :
Dept. of Electr. Eng., Nat. Univ. of Singapore, Singapore
fDate :
3/14/1996 12:00:00 AM
Abstract :
An improved prototype of the multi-state four port reflectometer (which uses only two power detectors) is used for measuring the complex reflection coefficients of microwave devices. Laboratory tests indicate that the measurement uncertainties for the proposed instrument are within ±0.01 for magnitude and ±1.5° for phase
Keywords :
calibration; microwave devices; microwave reflectometry; power measurement; reflectometers; complex reflection coefficients; four-port instrument; microwave devices; power detectors; reflectometer;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19960385
