DocumentCode
79615
Title
Investigation of the Surface Adhesion Phenomena and Mechanism of Gold-Plated Contacts at Superlow Making/Breaking Speed
Author
Wanbin Ren ; Cheng Chang ; Yu Chen ; Shengjun Xue ; Coutu, Ronald A.
Author_Institution
Sch. of Electr. Eng. & Autom., Harbin Inst. of Technol., Harbin, China
Volume
5
Issue
6
fYear
2015
fDate
Jun-15
Firstpage
771
Lastpage
778
Abstract
Surface adhesion phenomena of gold-plated copper contact materials are studied in conditions of nonarc load (5/15/25 V and 0.2/0.5/1 A) and superlow speed (25 and 50 nm/s) realized by a piezoactuator during the making and breaking processes. It is shown that softening and melting of local asperities leads to interface adhesion, which results from the joule heat generated by the contact resistance; it is determined that the change of contact force with time obeys the negative exponential distribution and the time constant is associated with the adhesion force directly. Based on the fitting experimental data, the relationship between the adhesion force Fz and the contact resistance Rd while breaking can be expressed as Fz ∝ Rd-1, which indicates that the main component of contact resistance is the bulk resistance of weld nugget and the constriction resistance is negligible.
Keywords
adhesion; contact resistance; copper; gold; melting; Au-Cu; adhesion force; bulk resistance; constriction resistance; contact force; contact resistance; current 0.2 A to 1 A; fitting experimental data; gold-plated copper contact materials; interface adhesion; joule heat generated; local asperities; melting; negative exponential distribution; nonarc load; piezoactuator; softening; superlow making-breaking speed; surface adhesion; time constant; voltage 5 V to 25 V; weld nugget; Adhesives; Contact resistance; Force; Loading; Resistance; Softening; Adhesion force; contact resistance; electrical contact; gold-plated material; joule heating; joule heating.;
fLanguage
English
Journal_Title
Components, Packaging and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
2156-3950
Type
jour
DOI
10.1109/TCPMT.2015.2431494
Filename
7113833
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