Recent advances in partial discharge measurement capabilities at NIST

Author

Van Brunt, R.J. ; Stricklett, K.L. ; Steiner, J.P. ; Kulkarni, S.V.

Author_Institution

Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA

Volume

27

Issue

1

fYear

1992

fDate

2/1/1992 12:00:00 AM

Firstpage

114

Lastpage

129

Abstract

Three techniques for measuring the properties of partial discharges (PDs) are described. The first is concerned with an advanced, real-time PD measurement system that allows a complete characterization of the stochastic properties of PD. With this system it is possible to measure a set of conditional PD pulse-amplitude and pulse-time separation distributions from which memory effects characteristic of the discharge phenomena can be quantified and interpreted. Results for pulsating negative corona discharges in gases are shown. The second technique allows PD location in cables using time-domain reflectometry with appropriate statistical analysis. With the third technique, simultaneous measurements are made of the optical and electrical characteristics of PD in liquid dielectrics using fast photography combined with broadband. low-noise pulse current measurements

Keywords

cable testing; charge measurement; corona; fault location; insulation testing; partial discharges; time-domain reflectometry; NIST; cables; fast photography; liquid dielectrics; low-noise pulse current measurements; memory effects; partial discharge measurement; pulsating negative corona discharges; pulse amplitude distribution; pulse-time separation distributions; real-time PD measurement system; statistical analysis; stochastic properties; time-domain reflectometry; Corona; Current measurement; Dielectric liquids; Fault location; Gases; Partial discharge measurement; Partial discharges; Pulse measurements; Real time systems; Stochastic systems;

fLanguage

English

Journal_Title

Electrical Insulation, IEEE Transactions on

Publisher

ieee

ISSN

0018-9367

Type

jour

DOI

10.1109/14.123447

Filename

123447