DocumentCode
796535
Title
Simple bounds on serial signature analysis aliasing for random testing
Author
Saxena, Nirmal R. ; Franco, Piero ; McCluskey, Edward J.
Author_Institution
Stanford Univ., CA, USA
Volume
41
Issue
5
fYear
1992
fDate
5/1/1992 12:00:00 AM
Firstpage
638
Lastpage
645
Abstract
It is shown that the aliasing probability is bounded above by (1+ε)/L ≈1/L (ε small for large L ) for test lengths L less than the period, L c, of the signature polynomial; for test lengths L that are multiples of L c, the aliasing probability is bounded above by 1; for test lengths L greater than L c and not a multiple of L c, the aliasing probability is bounded above by 2/( L c+1). These simple bounds avoid any exponential complexity associated with the exact computation of the aliasing probability. Simple bounds also apply to signature analysis based on any linear finite state machine (including linear cellular automaton). From these simple bounds it follows that the aliasing probability in a signature analysis design using β intermediate signatures is bounded by ((1+ε)βββ)/L β, for β<L and L /β<L c. By using intermediate signatures the aliasing probability can be substantially reduced
Keywords
computational complexity; finite automata; integrated circuit testing; logic testing; probability; aliasing probability; intermediate signatures; linear cellular automaton; linear finite state machine; random testing; serial signature analysis aliasing; signature polynomial; simple bounds; Analytical models; Automata; Automatic testing; Circuit faults; Circuit testing; Compaction; Linear code; Linear feedback shift registers; Polynomials; Very large scale integration;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/12.142690
Filename
142690
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