Title :
The Long-Term Effects of Radiation on Complementary MOS Logic Networks
Author :
Poch, W.J. ; Holmes-Siedle, A.G.
Author_Institution :
RCA Astro-Electronics Division Princeton, N. J.
Keywords :
CMOS logic circuits; Failure analysis; Insulation; Inverters; Ionizing radiation; Logic devices; MOS devices; MOSFETs; Silicon; Threshold voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1970.4325764
