Title :
A high-speed 16-kb GaAs SRAM of less than 5 ns using triple-level metal interconnection
Author :
Noda, Minoru ; Matsue, Shuichi ; Sakai, Masayuki ; Sumitani, Kouichi ; Nakano, Hirofumi ; Oku, Tomoki ; Makino, Hiroshi ; Nishitani, Kazuo ; Otsubo, Mutsuyuki
Author_Institution :
Mitsubishi Electr. Corp., Hyogo, Japan
fDate :
3/1/1992 12:00:00 AM
Abstract :
The authors have realized 16-kb SRAMs with maximum address access time of less than 5 ns and typical power dissipation of less than 2 W at temperatures ranging from 25°C to 100°C. For the RAMs, they have developed a triple-level Au-based interconnection technology that reduces the wiring length and chip size of the SRAM so as to achieve high speed and high yield. Consequently, the wiring length and chip size are reduced to 69% and 58%, respectively, of those obtained by in previous work. The authors experimentally compared the delay time incurred by double-level interconnection and that by triple-level interconnection. This ratio is found to agree well with the simulated one by a model with distributed RC delay. After successfully suppressing Au hillock generation by lowering the process temperature, yield per wafer of 10% is obtained
Keywords :
III-V semiconductors; SRAM chips; VLSI; field effect integrated circuits; gallium arsenide; gold; metallisation; 16 kbit; 2 W; 25 to 100 C; 5 ns; Au hillock suppression; Au metallisation; GaAs; SRAMs; address access time; chip size; delay time; distributed RC delay; power dissipation; process temperature; semiconductors; temperatures; triple-level interconnection; triple-level metal interconnection; wiring length; yield per wafer; Capacitance; Delay effects; Delay estimation; Gallium arsenide; Integrated circuit interconnections; Laboratories; Random access memory; Research and development; Temperature distribution; Wiring;
Journal_Title :
Electron Devices, IEEE Transactions on