• DocumentCode
    797204
  • Title

    Thermal and Radiation Stability of Thin-Film Cermet Resistive Elements

  • Author

    Tarpley, John L.

  • Volume
    17
  • Issue
    6
  • fYear
    1970
  • Firstpage
    373
  • Lastpage
    379
  • Abstract
    Recent laboratory experiments indicate that cermet thin-film resistors consisting of an 80/20 mixture of chromium and silicon monoxide can be fabricated to high sheet resistances up to 4500 ohms per square. These films show a pronounced thermal stability of <1 ppm/°C from -50°C to +175°C. Radiation stability of the films is ¿1% variance in absolute resistance for fluences up to 1 × 1015 e/cm2 at a 1.5 MeV energy level.
  • Keywords
    Ceramics; Chromium; Energy states; Laboratories; Resistors; Semiconductor thin films; Silicon; Thermal resistance; Thermal stability; Transistors;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1970.4325820
  • Filename
    4325820
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=797204