• DocumentCode
    797477
  • Title

    Pulsed Feedback Tecniques for Semicondctor Detector Radiation Spectrometers

  • Author

    Landis, D.A. ; Goulding, F.S. ; Pehl, R.H. ; Walto, J.T.

  • Author_Institution
    Lawrence Radiation Laboratory University of Califomia Berkeley, California
  • Volume
    18
  • Issue
    1
  • fYear
    1971
  • Firstpage
    115
  • Lastpage
    124
  • Abstract
    Methods of applying pulsed-charge feedback to the charge-sensitive preamplifiers used with semiconductor detectors are discussed. All have in commn the accumulation of radiation-induced charge pulses on a feedback capacitor to produce a voltage ramp at the output of the feedback stage, which is reset at an appropriate point by pulsing a charge feedback path. Advantages of pulsed feedback over the conventional dc feedback techniques are discussed, together with the precautions required to reduce the effect of the large reset pulse on the later electronics. The application of pulsed-light feedback to low energy X-ray spectrometers is discussed and results are presented. We also discuss sane aspects of this system that tend to limit its high-rate performance. A brief account of the use of a transistor current-switch feedback system to reduce overload problems in high-energy ??-ray spectrometers is also given.
  • Keywords
    FETs; Feedback; Leakage current; Photodiodes; Preamplifiers; Radiation detectors; Resistors; Semiconductor device noise; Spectroscopy; Voltage;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1971.4325851
  • Filename
    4325851