DocumentCode :
797635
Title :
Direct silicon-silicon bonding by electromagnetic induction heating
Author :
Thompson, Keith ; Gianchandani, Yogesh B. ; Booske, John ; Cooper, Reid F.
Author_Institution :
Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
Volume :
11
Issue :
4
fYear :
2002
fDate :
8/1/2002 12:00:00 AM
Firstpage :
285
Lastpage :
292
Abstract :
A novel heating technique, electromagnetic induction heating (EMIH), uses electromagnetic radiation, ranging in frequency from a few megahertz to tens of gigahertz, to volumetrically heat silicon above 1000°C in only a few seconds. Typical power requirements fall between 900 to 1300 W for silicon wafers 75 to 100 mm in diameter. This technique has successfully produced direct silicon wafer-to-wafer bonds without the use of an intermediate glue layer. Infrared images indicate void free bonds that could not be delaminated with knife-edge tests. In addition, four pairs of stacked wafers were bonded simultaneously in 5 min, demonstrating the potential for multiwafer bonds and high-throughput batch processing.
Keywords :
elemental semiconductors; induction heating; microwave heating; silicon; wafer bonding; 900 to 1300 W; Si-Si; direct silicon-silicon bonding; electromagnetic induction heating; heavily doped wafers; high-throughput batch processing; infrared images; intrinsic wafers; knife-edge tests; multiwafer bonds; power absorption efficiency; rapid heating; skin depth; stacked wafers; void free bonds; wafer-to-wafer bonds; Bonding processes; Electromagnetic heating; Electromagnetic induction; Electromagnetic radiation; Frequency; Furnaces; Manufacturing; Silicon on insulator technology; Temperature; Wafer bonding;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/JMEMS.2002.800929
Filename :
1022838
Link To Document :
بازگشت