• DocumentCode
    797635
  • Title

    Direct silicon-silicon bonding by electromagnetic induction heating

  • Author

    Thompson, Keith ; Gianchandani, Yogesh B. ; Booske, John ; Cooper, Reid F.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
  • Volume
    11
  • Issue
    4
  • fYear
    2002
  • fDate
    8/1/2002 12:00:00 AM
  • Firstpage
    285
  • Lastpage
    292
  • Abstract
    A novel heating technique, electromagnetic induction heating (EMIH), uses electromagnetic radiation, ranging in frequency from a few megahertz to tens of gigahertz, to volumetrically heat silicon above 1000°C in only a few seconds. Typical power requirements fall between 900 to 1300 W for silicon wafers 75 to 100 mm in diameter. This technique has successfully produced direct silicon wafer-to-wafer bonds without the use of an intermediate glue layer. Infrared images indicate void free bonds that could not be delaminated with knife-edge tests. In addition, four pairs of stacked wafers were bonded simultaneously in 5 min, demonstrating the potential for multiwafer bonds and high-throughput batch processing.
  • Keywords
    elemental semiconductors; induction heating; microwave heating; silicon; wafer bonding; 900 to 1300 W; Si-Si; direct silicon-silicon bonding; electromagnetic induction heating; heavily doped wafers; high-throughput batch processing; infrared images; intrinsic wafers; knife-edge tests; multiwafer bonds; power absorption efficiency; rapid heating; skin depth; stacked wafers; void free bonds; wafer-to-wafer bonds; Bonding processes; Electromagnetic heating; Electromagnetic induction; Electromagnetic radiation; Frequency; Furnaces; Manufacturing; Silicon on insulator technology; Temperature; Wafer bonding;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/JMEMS.2002.800929
  • Filename
    1022838