Title : 
High-Performance Split-Gate Enhanced UMOSFET With p-Pillar Structure
         
        
            Author : 
Ying Wang ; Hai-Fan Hu ; Cheng-Hao Yu ; Hao Lan
         
        
            Author_Institution : 
Coll. of Inf. & Commun. Eng., Harbin Eng. Univ., Harbin, China
         
        
        
        
        
        
        
        
            Abstract : 
In this paper, a split-gate resurf stepped oxide (RSO) vertical UMOSFET with p-pillar under the p+ plug region structure is proposed. The p-pillar could modulate the electric field of the drift region with the split-gate in 3-D and simultaneously brings electric field peaks at the sidewall junction between p-pillar and n-drift region. Thus the split-gate enhanced with p-pillar (SGEP) UMOS could increase the drift region doping concentration, reduce the on-state-specific resistance, and maintains the breakdown voltage as compared with the super junction and split-gate RSO UMOSs. Numerical simulation results show that the charge imbalance endurance of SGEP is also largely increased.
         
        
            Keywords : 
MOSFET; numerical analysis; semiconductor device models; semiconductor doping; RSO vertical UMOSFET; SGEP UMOS; breakdown voltage; charge imbalance endurance; drift region doping concentration; electric field; high-performance split-gate enhanced UMOSFET; n-drift region; numerical simulation; on-state-specific resistance; p-pillar structure; p+ plug region structure; sidewall junction; split-gate enhanced with p-pillar UMOS; split-gate resurf stepped oxide vertical UMOSFET; superjunction RSO UMOS; Breakdown voltage (BV); on-state specific resistance (RSP); split-gate; trench gate UMOSFET;
         
        
        
            Journal_Title : 
Electron Devices, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TED.2013.2260547