Title :
I/O Clustering in Design Cost and Performance Optimization for Flip-Chip Design
Author :
Hung-Ming Chen ; I-Min Liu ; Wong, Martin D. F.
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu
Abstract :
Input-output (I/O) placement has always been a concern in modern integrated circuit design. Due to flip-chip technology, I/O can be placed throughout the whole chip without long wires from the periphery of the chip. However, because of I/O placement constraints in design cost (DC) and performance, I/O buffer planning becomes a pressing problem. During the early stages of circuits and package co-design, I/O layout should be evaluated to optimize DC and to avoid product failures. The objective of this brief is to improve the existing/initial standard cell placement by I/O clustering, considering DC reduction and signal integrity preservation. The authors formulate it as a minimum cost flow problem that minimizes alphaW+betaD, where W is the I/O wirelength of the placement and D is the total voltage drop in the power network and, at the same time, reduces the number of I/O buffer blocks. The experimental results on some Microelectronics Center of North Carolina benchmarks show that the author´s method averagely achieves better timing performance and over 32% DC reduction when compared with a conventional rule-of-thumb design that is popularly used by circuit designers
Keywords :
buffer circuits; circuit optimisation; flip-chip devices; integrated circuit design; logic design; I/O buffer planning; I/O clustering; I/O wirelength; chip-package co-design; circuit designers; design cost optimization; design performance optimization; flip-chip design; input-output placement; input-output planning; integrated circuit design; signal integrity; standard cell placement; Cost function; Integrated circuit synthesis; Integrated circuit technology; Microelectronics; Optimization; Packaging; Pressing; Timing; Voltage; Wires; Chip-package co-design; flip-chip design; input–output (I/O) planning; signal integrity;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2006.873900