Title :
Efficient Interconnect Test Patterns for Crosstalk and Static Faults
Author :
Min, Pyoungwoo ; Yi, Hyunbean ; Song, Jaehoon ; Baeg, Sanghyeon ; Park, Sungju
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Hanyang Univ., Kyunggi-Do
Abstract :
This paper introduces effective test patterns for system-on-chip and board interconnects. Initially, "6n" patterns are introduced to completely detect and diagnose both static and crosstalk faults, where "n" is the total number of interconnect nets. Then, more economic "4n+1" patterns are described to test the crosstalk faults for the interconnect nets separated within a certain distance
Keywords :
automatic test pattern generation; crosstalk; fault simulation; integrated circuit interconnections; integrated circuit testing; system-on-chip; board interconnects; crosstalk faults; interconnect test patterns; static faults; system-on-chip; Circuit faults; Crosstalk; Delay; Environmental economics; Fault detection; Integrated circuit interconnections; Logic testing; System testing; System-on-a-chip; Test pattern generators; Crosstalk faults; interconnect test; static faults; system-on-chip (SoC);
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2006.873899
