DocumentCode :
798253
Title :
Improvements in electrostatic discharge performance of InGaAsP semiconductor lasers by facet passivation
Author :
DeChiaro, Louis F. ; Sandroff, Claude J.
Author_Institution :
Bellcore, Red Bank, NJ, USA
Volume :
39
Issue :
3
fYear :
1992
fDate :
3/1/1992 12:00:00 AM
Firstpage :
561
Lastpage :
565
Abstract :
Chemically treating laser facets with aqueous sulfides can significantly improve the electrostatic discharge (ESD) performance of InGaAsP semiconductor lasers. Commercial lasers free of internal defects were subjected to forward-biased Human Body Model ESD stress pulses. Devices passivated with sulfides exhibited a mean ESD failure voltage more than 400% higher than that of the untreated control group. Subsequent accelerated aging experiments suggest that a thick layer of oxide covering the laser facets, largely removed by the sulfide treatment, is responsible for the low ESD failure voltage on untreated devices. This suggests that sulfide passivation followed by facet encapsulation in a robust dielectric could result in permanent protection against ESD failure
Keywords :
III-V semiconductors; aluminium compounds; electrostatic discharge; encapsulation; gallium arsenide; gallium compounds; indium compounds; passivation; semiconductor junction lasers; ESD; ESD failure voltage; ESD stress pulses; Human Body Model; InGaAsP semiconductor lasers; accelerated aging experiments; aqueous sulfides; aqueous sulphides; electrical overstress; electrostatic discharge performance; facet encapsulation; facet passivation; permanent protection; semiconductors; Accelerated aging; Biological system modeling; Chemical lasers; Electrostatic discharge; Humans; Internal stresses; Laser modes; Optical pulses; Semiconductor lasers; Voltage control;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.123478
Filename :
123478
Link To Document :
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