DocumentCode :
79849
Title :
Nanosecond Snapshots of High-Power Microwave Discharge in Waveguides
Author :
Chao Chang ; Le Tian Guo ; Chun Liang Liu ; Yan Sheng Liu ; Min An Guo ; Tong Ding Luo ; Jin Xie ; Dong Yang Wang ; Chang Hua Chen
Author_Institution :
Sci. & Technol. on High Power Microwave Lab., Northwest Inst. of Nucl. Technol., Xi´an, China
Volume :
43
Issue :
6
fYear :
2015
fDate :
Jun-15
Firstpage :
1887
Lastpage :
1893
Abstract :
Using the same bend waveguide with two different E-field polarization directions, the breakdown phenomena in a curved waveguide with different power capacities were studied. For the case of lower power capacity, breakdown happens at the curved arm; with increasing incident power, the reflected peak amplitude increases, the breakdown delay time becomes shorter, and the reflected pulse gradually overlaps with the incident one, forming a slower falling edge at the end of incident pulse. For the case of higher power capacity, discharge may occur at the connected flanges without the choke shot. Using the four-frame intensified-charged-coupled device diagnosing the nanosecond light emission in each of the vertical and horizontal polarization cases, the intensities in both of the surface layer and the space beyond were found to first become bright during the microwave pulse, and then get dark after the pulse. The multiple bright spots on the wall illustrate the nonuniform plasma development and local high-density plasma at the microprotrusions with field enhancement, triggering the intense high-field emission or explosive emission.
Keywords :
charge-coupled devices; high-frequency discharges; plasma diagnostics; plasma filled waveguides; vacuum breakdown; E-field polarization directions; bend waveguide; breakdown delay time; breakdown phenomena; connected flanges; curved arm; curved waveguide; explosive emission; falling edge; field enhancement; four-frame intensified-charged-coupled device; high-power microwave discharge; horizontal polarization; incident power; incident pulse; intense high-field emission; local high-density plasma; microprotrusions; microwave pulse; multiple bright spots; nanosecond light emission; nanosecond snapshots; nonuniform plasma development; power capacities; reflected peak amplitude; reflected pulse; surface layer; vertical polarization; Discharges (electric); Microwave FET integrated circuits; Microwave integrated circuits; Optical pulses; Optical waveguides; High-power microwave; vacuum breakdown; waveguide discharge; waveguide discharge.;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2015.2431724
Filename :
7113909
Link To Document :
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