DocumentCode :
798694
Title :
Magnetization Reversal Mechanism in γ-Fe2O3 Thin Films
Author :
Ishii, O. ; Yoshimura, F. ; Hirono, S.
Author_Institution :
NTT.
Volume :
6
Issue :
9
fYear :
1991
Firstpage :
730
Lastpage :
736
Abstract :
Magnetization reversal was studied in Co-Ti-Cu doped γ-Fe2O3 thin films, prepared by sputtering and heat treatment. The crystal grain size dependence of the coercivity suggested that the fanning mode is the most likely mechanism of reversal. The coercivity decreases with decreasing grain size because thermally activated magnetization reversal takes place. Rotational hysteresis integrals for the films ranged from 1.47 to 1.58, equal to those for the fanning mode.
Keywords :
Coercive force; Grain size; Heat treatment; Magnetic films; Magnetic hysteresis; Magnetic recording; Magnetics Society; Magnetization reversal; Sputtering; Transistors;
fLanguage :
English
Journal_Title :
Magnetics in Japan, IEEE Translation Journal on
Publisher :
ieee
ISSN :
0882-4959
Type :
jour
DOI :
10.1109/TJMJ.1991.4565243
Filename :
4565243
Link To Document :
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