DocumentCode :
799017
Title :
A coupled plasma and sheath model for high density reactors
Author :
Bose, Deepak ; Govindan, T.R. ; Meyyappan, M.
Author_Institution :
Eloret Corp., NASA Ames Res. Center, Moffett Field, CA, USA
Volume :
30
Issue :
2
fYear :
2002
fDate :
4/1/2002 12:00:00 AM
Firstpage :
653
Lastpage :
659
Abstract :
We present a coupled plasma and collisionless sheath model for the simulation of high-density plasma processing reactors. Due to inefficiencies in numerical schemes and the resulting computational burden, a coupled multidimensional plasma and sheath simulation has not been possible for gas mixtures and high-density reactors of practical interest. In this work, we demonstrate that with a fully implicit algorithm and a refined computational mesh, a self-consistent simulation of a reactor including both the plasma and sheath is feasible. We discuss the details of the model equations, the importance of ion inertia, and the resulting sheath profiles for argon and chlorine plasmas. We find that at low operating pressures (10-30 mtorr), the charge separation occurs only within a 0.5-mm layer near the surface in a 300 mm inductively coupled plasma etch reactor. A unified simulation eliminates the use of offline or loosely coupled and oversimplified sheath models which generally leads to uncertainties in ion flux and sheath electrical properties.
Keywords :
plasma materials processing; plasma pressure; plasma sheaths; plasma simulation; 10 to 30 mtorr; charge separation; collisionless sheath model; computational burden; computational mesh; coupled multidimensional plasma; coupled plasma-sheath model; fully implicit algorithm; high density reactors; high-density plasma processing reactors; high-density reactors; inductively coupled plasma etch reactor; ion flux; loosely coupled sheath models; model equations; numerical schemes; offline coupled sheath models; operating pressures; plasma materials-processing applications; plasma simulation; self-consistent simulation; sheath electrical properties; sheath profiles; sheath simulation; Argon; Computational modeling; Equations; Inductors; Multidimensional systems; Plasma applications; Plasma density; Plasma materials processing; Plasma sheaths; Plasma simulation;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2002.1024264
Filename :
1024264
Link To Document :
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