• DocumentCode
    799537
  • Title

    Reversed Temperature-Dependent Propagation Delay Characteristics in Nanometer CMOS Circuits

  • Author

    Kumar, Ranjith ; Kursun, Volkan

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI
  • Volume
    53
  • Issue
    10
  • fYear
    2006
  • Firstpage
    1078
  • Lastpage
    1082
  • Abstract
    The supply voltage to threshold voltage ratio is reduced with each new technology generation. The gate overdrive variation with temperature plays an increasingly important role in determining the speed characteristics of CMOS integrated circuits. The temperature-dependent propagation delay characteristics, as shown in this brief, will experience a complete reversal in the near future. Contrary to the older technology generations, the speed of circuits in a 45-nm CMOS technology is enhanced when the temperature is increased at the nominal supply voltage. Operating an integrated circuit at the prescribed nominal supply voltage is not preferable for reliable operation under temperature fluctuations. A design methodology based on optimizing the supply voltage for temperature-variation-insensitive circuit performance is proposed in this brief. The optimum supply voltage is 45% to 53% lower than the nominal supply voltage in a 180-nm CMOS technology. Alternatively, the optimum supply voltage is 15% to 35% higher than the nominal supply voltage in a 45-nm CMOS technology. The speed and energy tradeoffs in the supply voltage optimization technique are also presented
  • Keywords
    CMOS integrated circuits; circuit optimisation; delays; integrated circuit design; nanoelectronics; 180 nm; 45 nm; high temperature speed; nanometer CMOS circuits; propagation delay characteristics; reversed temperature dependent; supply voltage scaling; temperature fluctuations; temperature variations; CMOS integrated circuits; CMOS technology; Design methodology; Design optimization; Fluctuations; Integrated circuit reliability; Integrated circuit technology; Propagation delay; Temperature; Threshold voltage; High temperature speed; supply voltage scaling; temperature variations;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Express Briefs, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-7747
  • Type

    jour

  • DOI
    10.1109/TCSII.2006.882218
  • Filename
    1715581