DocumentCode :
799562
Title :
The Control on Size and Density of InAs QDs by Droplet Epitaxy (April 2009)
Author :
Lee, Jihoon H. ; Wang, Zhiming M. ; Salamo, Gregory J.
Author_Institution :
Dept. of Electr. Eng., Kwangwoon Univ., Seoul, South Korea
Volume :
8
Issue :
4
fYear :
2009
fDate :
7/1/2009 12:00:00 AM
Firstpage :
431
Lastpage :
436
Abstract :
We report on the ability to grow InAs quantum dots (QDs) by droplet epitaxy (DE) using solid-source molecular beam epitaxy (MBE). In particular, the control of the size and density of InAs QDs at near room temperatures are achieved as a function of substrate temperature and crystallization condition. For a typical range of QD density ( ~109 to 1010 cm-2), the growth window is revealed to be fairly narrow ( ~20degC). In droplets are extremely sensitive to surface diffusion and arsenic background pressure even at near room temperatures. As a result, a very careful fabrication procedure is required to crystallize In droplets in order to fabricate desired shape of InAs QDs. For this purpose, we developed a double-step crystallization process, in which As background recovery and high-temperature crystallization are introduced. In addition, the results by DE are compared with QDs fabricated by Stranski-Krastanow (S-K) growth approach in terms of size and density. The results can find applications in optoelectronics as the fabrication of QDs by DE approach has more flexibility over S-K approach, i.e., more freedom of size and density control.
Keywords :
III-V semiconductors; crystallisation; drops; high-temperature effects; indium compounds; molecular beam epitaxial growth; nanofabrication; nanostructured materials; semiconductor growth; semiconductor quantum dots; surface diffusion; InAs; MBE; double-step crystallization process; droplet epitaxy; fabrication procedure; high-temperature crystallization; low-dimensional nanostructures; optoelectronics; quantum dot density control; quantum dot growth; quantum dot size control; recovery; solid-source molecular beam epitaxy; substrate temperature; surface diffusion; Atomic force microscopy (AFM); GaAs (1 $, 0$$, 0$); InAs quantum dots (QDs); droplet epitaxy (DE); molecular beam epitaxy (MBE);
fLanguage :
English
Journal_Title :
Nanotechnology, IEEE Transactions on
Publisher :
ieee
ISSN :
1536-125X
Type :
jour
DOI :
10.1109/TNANO.2009.2021654
Filename :
4907084
Link To Document :
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