DocumentCode :
799571
Title :
Thickness-shear vibrations of a quartz plate under time-dependent biasing deformations
Author :
Yang, Jiashi ; Zhang, Xnesong ; Kosinski, John A. ; Pastore, Robert A., Jr.
Author_Institution :
Dept. of Eng. Mech., Nebraska Univ., Lincoln, NE, USA
Volume :
50
Issue :
9
fYear :
2003
Firstpage :
1114
Lastpage :
1123
Abstract :
Incremental thickness-shear vibrations of a Y-cut quartz crystal plate under time-harmonic biasing extensional deformations are studied using the two-dimensional equations for small fields superposed on finite biasing fields in an electroelastic plate. It is shown that the incremental thickness-shear vibrations are governed by the well-known Mathieu´s equation with a time-dependent coefficient. Both free and electrically forced vibrations are studied. Approximate analytical solutions are obtained when the frequency of the biasing deformation is much lower than that of the incremental thickness-shear vibration. The incremental thickness-shear free vibration mode is shown to be both frequency and amplitude modulated, with the frequency modulation as a first-order effect and the amplitude modulation a second-order effect. The forced vibration solutions show that both the static and motional capacitances become time-dependent due to the time-harmonic biasing deformations.
Keywords :
capacitance; crystal resonators; frequency modulation; Mathieu´s equation; electrically forced vibrations; extensional deformations; finite biasing fields; first-order effect; frequency modulation; motional capacitances; piezoelectric crystal resonators; quartz plate; second-order effect; static capacitances; thickness-shear vibrations; time-dependent biasing deformations; time-dependent coefficient; two-dimensional equations; Acceleration; Amplitude modulation; Capacitance; Equations; Frequency modulation; Missiles; Resonance; Resonant frequency; Satellites; Vibrations;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/TUFFC.2003.1235323
Filename :
1235323
Link To Document :
بازگشت