DocumentCode :
79958
Title :
A Novel Closed-Loop Readout Topology for Monolithically Integrated Surface Acoustic Wave Sensors
Author :
Rakshit, Subrata ; Iliadis, Agis A.
Author_Institution :
Dept. of Electr. Eng., Univ. of Maryland, College Park, MD, USA
Volume :
13
Issue :
11
fYear :
2013
fDate :
Nov. 2013
Firstpage :
4264
Lastpage :
4270
Abstract :
A new frequency to voltage closed-loop integrated sensor circuit suitable for the read-out module of a monolithically integrated SAW sensor on Si is proposed. This closed-loop system consists of a voltage controlled oscillator, a peak detecting comparator, a finite state machine, and the monolithically integrated SAW sensor device. The output of the system is forced to oscillate within a narrow voltage range that correlates with the SAW pass-band response. The period of oscillation is of the order of the SAW phase delay. The output voltage range varies with changes in SAW center frequency, thus tracking mass sensing events in real time. The analysis and simulation of the system are presented for two SAW devices operating at 374 and 140 MHz, respectively. Experimental results for a test chip fabricated with AMIC5N 0.5 μm process are presented for comparison with simulation data of the 140 MHz design. Because of this frequency to voltage conversion, this approach is uniquely suitable for full monolithic integration of autonomous sensor systems and tags.
Keywords :
UHF detectors; UHF oscillators; VHF circuits; VHF oscillators; comparators (circuits); delay circuits; elemental semiconductors; finite state machines; integrated circuit testing; mass measurement; monolithic integrated circuits; peak detectors; readout electronics; silicon; surface acoustic wave sensors; voltage-controlled oscillators; AMIC5N process; SAW pass-band response; SAW phase delay; Si; closed-loop readout topology; finite state machine; frequency 140 MHz; frequency 374 MHz; frequency-voltage closed-loop integrated sensor circuit; frequency-voltage conversion; monolithically integrated surface acoustic wave sensor device; narrow voltage oscillate; peak detecting comparator; size 0.5 mum; test chip fabricated; tracking mass sensor; voltage controlled oscillator; FSM; SAW; VCO; discrete time; readout IC;
fLanguage :
English
Journal_Title :
Sensors Journal, IEEE
Publisher :
ieee
ISSN :
1530-437X
Type :
jour
DOI :
10.1109/JSEN.2013.2264901
Filename :
6521354
Link To Document :
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