DocumentCode :
799638
Title :
Ordering and finding the best of K > 2 supervised learning algorithms
Author :
Yildiz, Olcay Taner ; Alpaydin, Ethem
Author_Institution :
Dept. of Comput. Eng., Bogazici Univ., Istanbul, Turkey
Volume :
28
Issue :
3
fYear :
2006
fDate :
3/1/2006 12:00:00 AM
Firstpage :
392
Lastpage :
402
Abstract :
Given a data set and a number of supervised learning algorithms, we would like to find the algorithm with the smallest expected error. Existing pairwise tests allow a comparison of two algorithms only; range tests and ANOVA check whether multiple algorithms have the same expected error and cannot be used for finding the smallest. We propose a methodology, the multitest algorithm, whereby we order supervised learning algorithms taking into account 1) the result of pairwise statistical tests on expected error (what the data tells us), and 2) our prior preferences, e.g., due to complexity. We define the problem in graph-theoretic terms and propose an algorithm to find the "best" learning algorithm in terms of these two criteria, or in the more general case, order learning algorithms in terms of their "goodness." Simulation results using five classification algorithms on 30 data sets indicate the utility of the method. Our proposed method can be generalized to regression and other loss functions by using a suitable pairwise test.
Keywords :
graph theory; learning (artificial intelligence); statistical testing; ANOVA check; K > 2 supervised learning algorithms; classification algorithms; graph theory; multitest algorithm; pairwise statistical tests; smallest expected error; Analysis of variance; Classification algorithms; Design for experiments; Error analysis; Iterative algorithms; Machine learning; Machine learning algorithms; Probability; Supervised learning; Testing; Index Terms- Machine learning; classifier design and evaluation; experimental design.; Algorithms; Artificial Intelligence; Computer Simulation; Image Interpretation, Computer-Assisted; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity; Software;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.2006.61
Filename :
1580484
Link To Document :
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