• DocumentCode
    799648
  • Title

    A new regime for operating capacitive micromachined ultrasonic transducers

  • Author

    Bayram, Baris ; Haeggstrom, Edward ; Yaralioglu, Goksen G. ; Khuri-Yakub, Butrus T.

  • Author_Institution
    Edward L. Ginzton Lab., Stanford Univ., CA, USA
  • Volume
    50
  • Issue
    9
  • fYear
    2003
  • Firstpage
    1184
  • Lastpage
    1190
  • Abstract
    We report on a new operation regime for capacitive micromachined ultrasonic transducers (cMUTs). Traditionally, cMUTs are operated at a bias voltage lower than the collapse voltage of their membranes. In the new proposed operation regime, first the cMUT is biased past the collapse voltage. Second, the bias voltage applied to the collapsed membrane is reduced without releasing the membrane. Third, the cMUT is excited with an ac signal at the bias point, keeping the total applied voltage between the collapse and snapback voltages. In this operation regime, the center of the membrane is always in contact with the substrate. Our finite element methods (FEM) calculations reveal that a cMUT operating in this new regime, between collapse and snapback voltages, possesses a coupling efficiency (k/sub T//sup 2/) higher than a cMUT operating in the conventional regime below its collapse voltage. This paper compares the simulation results of the coupling efficiencies of cMUTs operating in conventional and new operation regimes.
  • Keywords
    capacitive sensors; finite element analysis; ultrasonic transducers; bias voltage; cMUTs; capacitive micromachined ultrasonic transducers; collapse voltage; collapsed membrane; coupling efficiency; finite element methods; simulation results; total applied voltage; Biomembranes; Electrodes; Electrostatics; Finite element methods; High K dielectric materials; High-K gate dielectrics; Power conversion; Silicon; Ultrasonic transducers; Voltage;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/TUFFC.2003.1235329
  • Filename
    1235329