DocumentCode :
799691
Title :
Relief texture from specularities
Author :
Wang, Jing ; Dana, Kristin J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Rutgers Univ., Piscataway, NJ, USA
Volume :
28
Issue :
3
fYear :
2006
fDate :
3/1/2006 12:00:00 AM
Firstpage :
446
Lastpage :
457
Abstract :
In vision and graphics, advanced object models require not only 3D shape, but also surface detail. While several scanning devices exist to capture the global shape of an object, few methods concentrate on capturing the fine-scale detail. Fine-scale surface geometry (relief texture), such as surface markings, roughness, and imprints, is essential in highly realistic rendering and accurate prediction. We present a novel approach for measuring the relief texture of specular or partially specular surfaces using a specialized imaging device with a concave parabolic mirror to view multiple angles in a single image. Laser scanning typically fails for specular surfaces because of light scattering, but our method is explicitly designed for specular surfaces. Also, the spatial resolution of the measured geometry is significantly higher than standard methods, so very small surface details are captured. Furthermore, spatially varying reflectance is measured simultaneously, i.e., both texture color and texture shape are retrieved.
Keywords :
image resolution; image texture; rendering (computer graphics); accurate prediction; concave parabolic mirror; fine-scale surface geometry; highly realistic rendering; measured geometry; partially specular surfaces; relief texture; spatial resolution; spatially varying reflectance; specialized imaging device; surface markings; texture color; texture shape; Geometry; Graphics; High-resolution imaging; Mirrors; Rendering (computer graphics); Rough surfaces; Shape measurement; Surface emitting lasers; Surface roughness; Surface texture; 3D texture; BTF; Index Terms- Texture; bidirectional texture function; curved mirror; reflectance; relief texture; roughness.; shape from specularity; Algorithms; Artificial Intelligence; Image Enhancement; Image Interpretation, Computer-Assisted; Imaging, Three-Dimensional; Information Storage and Retrieval; Light; Pattern Recognition, Automated; Photometry; Reproducibility of Results; Scattering, Radiation; Sensitivity and Specificity; Surface Properties;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.2006.63
Filename :
1580488
Link To Document :
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