Title :
Key technologies for system-integration in the automotive and Industrial Applications
Author :
Stecher, Matthias ; Jensen, Nils ; Denison, Marie ; Rudolf, Ralf ; Strzalkoswi, Bernhard ; Muenzer, Mark N. ; Lorenz, Leo
Author_Institution :
Infineon Technol. AG, Munich, Germany
fDate :
5/1/2005 12:00:00 AM
Abstract :
System integration and high power density of monolithic and multichip designs are the driving force for the progress in power electronic systems. The whole system has to be considered and optimized to meet this target and to keep the overall ruggedness, sensitivity toward electromagnetic interference and long term reliability, Silicon utilization system reliability and power units miniaturization are the key factors. In this paper new technologies, advanced devices concepts and future system aspect for system-integration in the automotive and industrial segments are discussed. In both fields of applications these are huge requirements toward system dynamic characteristic, overload capability, ruggedness behavior and reliability. In the automotive segment technologies working at high operating temperatures are required and in the industrial are high blocking voltage capabilities are needed.
Keywords :
automotive electronics; electromagnetic interference; integrated circuit reliability; optimisation; power electronics; silicon-on-insulator; automotive application; coreless transformer; electromagnetic interference; high voltage integrated circuit; industrial application; optimization; power density; power electronic system; power units miniaturization; silicon utilization system reliability; silicon-on-insulator; system integration; Automotive electronics; Automotive engineering; Consumer electronics; Electrical equipment industry; Electrostatic discharge; IEC standards; ISO standards; Power system reliability; Silicon on insulator technology; Temperature distribution; Coreless transformer; high voltage-integrated cir;cuits (ICs); silicon-on-insulator (SOI); smart power;
Journal_Title :
Power Electronics, IEEE Transactions on
DOI :
10.1109/TPEL.2005.846891