Title :
BILCO: built in testing method for combinational logic circuits
Author_Institution :
Sch. of Electr. Eng., Electron. & Phys., Liverpool John Moores Univ., UK
fDate :
1/4/1996 12:00:00 AM
Abstract :
The testing of digital logic circuits has become quite complex owing to miniaturisation and its associated increase in circuit function per unit area. Methods have been devised for testing ASIC products and, latterly, board level products. A new method (BILCO) is presented for probing asynchronous combinational logic circuits using a novel development of scan path principles
Keywords :
application specific integrated circuits; asynchronous circuits; built-in self test; combinational circuits; integrated circuit testing; logic testing; ASIC products; BILCO; asynchronous combinational logic; board level products; built in testing method; circuit function; combinational logic circuits; scan path principles;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19960012
