DocumentCode :
799909
Title :
Carbon Nanotube Field-Effect Transistors for High-Performance Digital Circuits—Transient Analysis, Parasitics, and Scalability
Author :
Keshavarzi, Ali ; Raychowdhury, Arijit ; Kurtin, Juanita ; Roy, Kaushik ; De, Vivek
Author_Institution :
Intel Corp., Hillsboro, OR
Volume :
53
Issue :
11
fYear :
2006
Firstpage :
2718
Lastpage :
2726
Abstract :
Silicon-based CMOS is the dominant technology choice for high-performance digital circuits. While silicon technology continues to scale, researchers are investigating other novel materials, structures, and devices to introduce into future technology generations, if necessary, to extend Moore´s law. Carbon nanotubes (CNTs) have been explored as a possibility due to their excellent carrier mobility. The authors studied and compared different carbon-nanotube-based field-effect transistors (CNFETs) including Schottky-barrier (SB) CNFETs, MOS CNFETs, and state-of-the-art Si MOSFETs systematically from a circuit/system design perspective. Parasitics play a major role in the performance of CNT-based circuits. The data in this paper show that CNFET design´s performance is limited by the gate overlap capacitance and the quality of nanocontacts to these promising transistors. Transient analysis of high-performing single-tube SB CNFET transistors and circuits revealed that 1-1.5 nm is the optimum CNT diameter resulting in best power-performance tradeoff for high-speed digital applications. The authors determined optimal spacing and layout of CNT arrays, an architecture that is most likely required for driving capacitive loads and interconnects in digital applications. CNTs have an intrinsic capability to improve performance, but many serious technological and experimental challenges remain that require more research to harvest their potential
Keywords :
carbon nanotubes; digital circuits; field effect transistors; nanotechnology; transient analysis; 1 to 1.5 nm; MOS CNFET; Schottky-barrier CNFET; carbon nanotube field-effect transistors; carrier mobility; design performance; high-performance digital circuits; optimal layout; optimal spacing; packing density; parasitic capacitance; parasitic resistance; state-of-the-art MOSFET; transient analysis; CMOS digital integrated circuits; CMOS technology; CNTFETs; Carbon nanotubes; Circuit analysis; Digital circuits; MOSFETs; Moore´s Law; Scalability; Silicon; Carbon nanotube field-effect transistors (CNFETs); high-performance circuits; packing density; parasitic resistance and capacitance; transient analysis;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2006.883813
Filename :
1715614
Link To Document :
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