• DocumentCode
    799923
  • Title

    Integrated CoolMOS FET/SiC-diode module for high performance power switching

  • Author

    Liang, Zhenxian ; Lu, Bing ; Van Wyk, Jacobus Daniel ; Lee, Fred C.

  • Author_Institution
    Center for Power Electron. Syst., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
  • Volume
    20
  • Issue
    3
  • fYear
    2005
  • fDate
    5/1/2005 12:00:00 AM
  • Firstpage
    679
  • Lastpage
    686
  • Abstract
    A Si CoolMOS field effect transistor and SiC diode assembly with gate driver in boost configuration (ratings at 600V/12A), for power factor correction application, has been fabricated in a version of an integrated power electronic module. It uses the so-called embedded power technology, to form a three-dimensional multiple chip/component interconnection with the embedded chips in a co-planar ceramic substrate with thin-film metallization bond/interconnection added on top. In this paper, the switching parameters of this module and their effects on the performance of a converter have been analyzed and experimentally characterized. The procedures adopted for the defined fabrication process of planar metallization interconnects are presented. In addition to the improvement of structural electrical properties, compared to a conventional discrete version, the characteristics of the planar process integration have also been demonstrated.
  • Keywords
    MOSFET; driver circuits; monolithic integrated circuits; power factor correction; power semiconductor diodes; power semiconductor switches; switching convertors; thin film circuits; SiC diode module; converter performance; coplanar ceramic substrate; electrical property; embedded chips; embedded power technology; field effect transistor; gate driver; high performance power switching; integrated CoolMOSFET; integrated power electronic fabrication; planar metallization interconnection; power factor correction; semiconductor switching; switching parameters; thin-film metallization bond; Assembly; Ceramics; Diodes; Driver circuits; FETs; Metallization; Power electronics; Power factor correction; Silicon carbide; Substrates; Power electronics module integration; power semiconductor switching; structural electromagnetic parameters;
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/TPEL.2005.846547
  • Filename
    1427826