Title :
Integrated CoolMOS FET/SiC-diode module for high performance power switching
Author :
Liang, Zhenxian ; Lu, Bing ; Van Wyk, Jacobus Daniel ; Lee, Fred C.
Author_Institution :
Center for Power Electron. Syst., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
fDate :
5/1/2005 12:00:00 AM
Abstract :
A Si CoolMOS field effect transistor and SiC diode assembly with gate driver in boost configuration (ratings at 600V/12A), for power factor correction application, has been fabricated in a version of an integrated power electronic module. It uses the so-called embedded power technology, to form a three-dimensional multiple chip/component interconnection with the embedded chips in a co-planar ceramic substrate with thin-film metallization bond/interconnection added on top. In this paper, the switching parameters of this module and their effects on the performance of a converter have been analyzed and experimentally characterized. The procedures adopted for the defined fabrication process of planar metallization interconnects are presented. In addition to the improvement of structural electrical properties, compared to a conventional discrete version, the characteristics of the planar process integration have also been demonstrated.
Keywords :
MOSFET; driver circuits; monolithic integrated circuits; power factor correction; power semiconductor diodes; power semiconductor switches; switching convertors; thin film circuits; SiC diode module; converter performance; coplanar ceramic substrate; electrical property; embedded chips; embedded power technology; field effect transistor; gate driver; high performance power switching; integrated CoolMOSFET; integrated power electronic fabrication; planar metallization interconnection; power factor correction; semiconductor switching; switching parameters; thin-film metallization bond; Assembly; Ceramics; Diodes; Driver circuits; FETs; Metallization; Power electronics; Power factor correction; Silicon carbide; Substrates; Power electronics module integration; power semiconductor switching; structural electromagnetic parameters;
Journal_Title :
Power Electronics, IEEE Transactions on
DOI :
10.1109/TPEL.2005.846547