DocumentCode :
799956
Title :
Maximum likelihood parameter estimation in the extended Weibull distribution and its applications to breakdown voltage estimation
Author :
Hirose, Hideo
Author_Institution :
Dept. of Comput. Sci. & Electron., Kyushu Inst. of Technol., Fukuoka, Japan
Volume :
9
Issue :
4
fYear :
2002
fDate :
8/1/2002 12:00:00 AM
Firstpage :
524
Lastpage :
536
Abstract :
Although the Weibull distribution is widely used in a variety of reliability applications, difficulties in its treatment, particularly in three parameter cases in the maximum likelihood estimation, hinder us from using the distribution. The extended Weibull distribution proposed by Marshall and Olkin (1997) can avoid the difficulties which appear in the conventional Weibull distribution models. This paper shows the maximum likelihood estimation method in the extended Weibull distribution model. The paper also illustrates some typical applications for breakdown voltage estimation in which the extended models are superior to the conventional Weibull models. The central discussion is whether the shape parameters in the extended model accomplish the mass shifting effect of the distribution.
Keywords :
Weibull distribution; electric breakdown; maximum likelihood estimation; reliability theory; Kolmogorov statistic; Newton-Raphson; breakdown voltage estimation; continuation method; cumulative distribution; density functions; epoxy resin; extended Weibull distribution; extended two-parameter exponential; iterative methods; mass shifting effect; maximum likelihood parameter estimation; reliability; shape parameters; three parameter cases; transformer oil; Application software; Computer science; Data engineering; Maximum likelihood estimation; Parameter estimation; Reliability engineering; Shape; Systems engineering and theory; Voltage control; Weibull distribution;
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/TDEI.2002.1024429
Filename :
1024429
Link To Document :
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