• DocumentCode
    800001
  • Title

    Pattern classification of impulse faults in transformers by wavelet analysis

  • Author

    Purkai, P. ; Chakravorti, S.

  • Author_Institution
    Instrum. Eng. Dept., Haldia Inst. of Technol., Midnapore, India
  • Volume
    9
  • Issue
    4
  • fYear
    2002
  • Firstpage
    555
  • Lastpage
    561
  • Abstract
    One of the tests carried out on a transformer after assembly is the lightning impulse test, for assessment of the integrity of its winding insulation. In the case of a fault, it has been well established that the pattern of the fault currents contains a typical signature of the nature and location of the insulation failure involved. This paper describes a new approach using the ´wavelet transforms´ to classify the patterns inherent in different fault currents. Whereas conventional frequency-response analysis based techniques fail to identify the time-localization of a particular frequency component in a time-dependent signal, the wavelets are not only localized in frequency, but also in time. The ´time-frequency localization´ feature of wavelet transform is employed for pattern classification of impulse fault currents of transformers. Results for simulated models of 3 5 and 7 MVA transformers are presented to illustrate the ability of this approach to classify insulation failures.
  • Keywords
    EMTP; impulse testing; insulation testing; pattern classification; power transformer insulation; power transformer testing; signal classification; time-frequency analysis; wavelet transforms; 3 MVA; 3-D scatter plot; 5 MVA; 7 MVA; EMTP models; Morlet mother wavelet; clustering; fault currents; impulse faults; lightning impulse test; pattern classification; power transformers; time-frequency localization; transformer insulation failures; wavelet transforms; winding current waveforms; winding insulation integrity;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2002.1024433
  • Filename
    1024433