DocumentCode
800403
Title
Accurate analytical expression for reflection-peak wavelengths of sampled Bragg grating
Author
Zou, Xi-Hua ; Pan, Wei ; Luo, Bin ; Zhang, Wei-Li ; Wang, Meng-Yao
Author_Institution
Sch. of Inf. Sci. & Technol., Southwest Jiaotong Univ., Sichuan
Volume
18
Issue
3
fYear
2006
Firstpage
529
Lastpage
531
Abstract
An analytical expression for calculating the reflection-peak wavelengths of sampled Bragg grating (SBG) is achieved for the first time. The index modulation distribution of SBG is expanded into Fourier series; then the equivalent index modulation and local Bragg period are obtained to derive the expression. Consequently, the introduction of duty cycle and sampling period ensures the accuracy of expression. The phase-matching condition is well explained by the constant phase shift technique. Under this condition, the calculated results based on expression are in good agreement with the numerical reflection spectra obtained by the piecewise uniform method
Keywords
Bragg gratings; optical communication equipment; optical phase matching; reflectivity; refractive index; Fourier series; index modulation distribution; phase shift technique; phase-matching; piecewise uniform method; reflection spectra; reflection-peak wavelengths; sampled Bragg grating; Bragg gratings; Fourier series; Frequency conversion; Laser tuning; Optical fiber devices; Optical fiber dispersion; Optical frequency conversion; Optical reflection; Sampling methods; Wavelength division multiplexing; Gratings; optical fiber devices; reflection-peak wavelengths (RPWs); wavelength-division multiplexing;
fLanguage
English
Journal_Title
Photonics Technology Letters, IEEE
Publisher
ieee
ISSN
1041-1135
Type
jour
DOI
10.1109/LPT.2005.863629
Filename
1580555
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