Title :
Evaluating the Permeability Distribution of a Layered Conductor by Inductance Spectroscopy
Author :
Yin, Wuliang ; Dickinson, Stephen J. ; Peyton, Anthony J.
Author_Institution :
Sch. of Electr. & Electron. Eng., Manchester Univ.
Abstract :
This paper presents an inverse method for determining the permeability distribution of a flat, layered conductor by using a multifrequency electromagnetic sensor. It discusses the use of spectroscopic techniques to extract depth profiles and examine more fully the internal structure of the test piece. The forward solution for a small right-cylindrical air-cored coil placed next to a layered conductor is based on the analytic solution provided by the transfer matrix approach. For the inverse solution, a modified Newton-Raphson method is used to adjust the permeability profile to fit a set of multifrequency inductances in a least-squared sense. The approximate Jacobian matrix (sensitivity matrix) is obtained by the perturbation method. The paper provides numerical results of the forward solution for cases of step and continuous permeability profiles. Inverse results based on experimental and simulated data verify the accuracy of this method, which yields good estimates for the permeability profile
Keywords :
Jacobian matrices; Newton-Raphson method; conductors (electric); electromagnetic devices; inverse problems; least squares approximations; permeability; perturbation techniques; sensors; transfer function matrices; Jacobian matrix; Newton-Raphson method; continuous permeability profiles; depth profiles; inductance spectroscopy; layered conductor; multifrequency electromagnetic sensor; multifrequency inductances; permeability distribution; perturbation method; right-cylindrical air-cored coil; sensitivity matrix; spectroscopic techniques; transfer matrix approach; Coils; Conductors; Inductance; Inverse problems; Jacobian matrices; Newton method; Permeability; Perturbation methods; Spectroscopy; Testing; Electromagnetic sensor; layered conductor; multifrequency; permeability distribution;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2006.880992