Title :
Temperature Dependence of Critical Current in Diffusion Processed Nb3Sn
Author :
Haller, T.R. ; Belanger, B.C.
Author_Institution :
General Electric Company Schenectady, New York
fDate :
6/1/1971 12:00:00 AM
Abstract :
Comprehensive critical current data for a short sample of General Electric diffusion processed Nb3Sn superconducting tape have been obtained by current-voltage (I-V) observation in magnetic fields up to 100 kOe (10 T) over the temperature range 4.2 K - 18 K. Cursory data obtained for a number of other short samples of diffusion processed Nb3Sn suggest that the results presented here are typical. Data on vapor deposited Nb3Sn reported by Aron and Ahlgrenl are generally similar in the range 10-60 kOe (1-6 T) where overlap occurs.
Keywords :
Copper; Critical current; Lead; Magnetic levitation; Niobium-tin; Plasma temperature; Superconducting films; Superconducting magnets; Temperature dependence; Temperature distribution;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1971.4326148
