Title :
Drift Tube Techniques for Active Semiconductor Testing in the Electron Beam of the Field Emission 705 Flash X-Ray Machine
Author :
Alexander, D.R. ; Hoffland, A.H.
fDate :
6/1/1971 12:00:00 AM
Abstract :
An evacuated drift tube has been designed and fabricated which enables the experimentor to use the electron beam of a 2 MeV flash X-ray machine for active, low noise irradiations of semiconductor devices. This paper gives design details of the drift tube and indicates the dose levels available as a function of tube parameters.
Keywords :
Active noise reduction; Circuit testing; Collimators; Electron beams; Electron tubes; Noise level; Radiation effects; Semiconductor device noise; Semiconductor device testing; Semiconductor devices;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1971.4326179
