DocumentCode
80149
Title
Product Level Accelerated Reliability Testing of Motor Drives With Input Power Interruptions
Author
Pippola, J. ; Vaalasranta, Ilkka ; Marttila, T. ; Kiilunen, Janne ; Frisk, Laura
Author_Institution
Dept. of Electr. Eng., Tampere Univ. of Technol., Tampere, Finland
Volume
30
Issue
5
fYear
2015
fDate
May-15
Firstpage
2614
Lastpage
2622
Abstract
Motor drives utilizing power semiconductors play an important role in modern day electric motor control. Although the reliability of power semiconductors is widely studied, the product level reliability of motor drives has been studied markedly less even though their more complex control and measuring electronics often make them more vulnerable to environmental stresses. In order to advance product level accelerated reliability testing, customized test methods with multiple simultaneous or sequential stresses can be used. However, the knowledge of combined effects of different stresses is still largely unknown. In this research the reliability of a commercial motor drive was studied. Environmental conditions used included an 85 °C constant temperature test and an 85 °C test with 85% relative humidity. Additionally, input power interruptions were included to study the effect of sudden shortages of electricity. The results of the study showed that the mean time to failure for the devices tested with the input power interruptions was notably shorter than that for the test series without them. An especially clear effect of the input power interruptions was seen on the power MOSFETs of the motor drives. Moreover, the humidity was found to play an important role in the reliability of the motor drives.
Keywords
MOSFET; humidity; life testing; machine control; motor drives; reliability; advance product level accelerated reliability testing; commercial motor drive; customized test methods; electric motor control; humidity; power MOSFET; power interruptions; power semiconductors; product level reliability; relative humidity; sequential stresses; temperature 85 C; Humidity; Insulated gate bipolar transistors; MOSFET; Motor drives; Reliability; Temperature measurement; Testing; Accelerated testing; humidity; input power interruptions; motor drive; product level testing; reliability;
fLanguage
English
Journal_Title
Power Electronics, IEEE Transactions on
Publisher
ieee
ISSN
0885-8993
Type
jour
DOI
10.1109/TPEL.2014.2359734
Filename
6906285
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