• DocumentCode
    80149
  • Title

    Product Level Accelerated Reliability Testing of Motor Drives With Input Power Interruptions

  • Author

    Pippola, J. ; Vaalasranta, Ilkka ; Marttila, T. ; Kiilunen, Janne ; Frisk, Laura

  • Author_Institution
    Dept. of Electr. Eng., Tampere Univ. of Technol., Tampere, Finland
  • Volume
    30
  • Issue
    5
  • fYear
    2015
  • fDate
    May-15
  • Firstpage
    2614
  • Lastpage
    2622
  • Abstract
    Motor drives utilizing power semiconductors play an important role in modern day electric motor control. Although the reliability of power semiconductors is widely studied, the product level reliability of motor drives has been studied markedly less even though their more complex control and measuring electronics often make them more vulnerable to environmental stresses. In order to advance product level accelerated reliability testing, customized test methods with multiple simultaneous or sequential stresses can be used. However, the knowledge of combined effects of different stresses is still largely unknown. In this research the reliability of a commercial motor drive was studied. Environmental conditions used included an 85 °C constant temperature test and an 85 °C test with 85% relative humidity. Additionally, input power interruptions were included to study the effect of sudden shortages of electricity. The results of the study showed that the mean time to failure for the devices tested with the input power interruptions was notably shorter than that for the test series without them. An especially clear effect of the input power interruptions was seen on the power MOSFETs of the motor drives. Moreover, the humidity was found to play an important role in the reliability of the motor drives.
  • Keywords
    MOSFET; humidity; life testing; machine control; motor drives; reliability; advance product level accelerated reliability testing; commercial motor drive; customized test methods; electric motor control; humidity; power MOSFET; power interruptions; power semiconductors; product level reliability; relative humidity; sequential stresses; temperature 85 C; Humidity; Insulated gate bipolar transistors; MOSFET; Motor drives; Reliability; Temperature measurement; Testing; Accelerated testing; humidity; input power interruptions; motor drive; product level testing; reliability;
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/TPEL.2014.2359734
  • Filename
    6906285