• DocumentCode
    801831
  • Title

    Comments on "On deembedding of port discontinuities in full-wave CAD models of multiport circuits" and related comments

  • Author

    Farina, Marco

  • Author_Institution
    Dept. of Electron. & Autom.s, Univ. of Ancona, Italy
  • Volume
    53
  • Issue
    5
  • fYear
    2005
  • fDate
    5/1/2005 12:00:00 AM
  • Firstpage
    1829
  • Abstract
    For original article by V. I. Okhmatovski, J. D. Morsey and A. C. Cangellaris see ibid vol.51, no.12, p.2355-65, Dec. 2003.
  • Keywords
    circuit CAD; coupled circuits; equivalent circuits; multiport networks; waveguide discontinuities; coupled multiport circuits; electromagnetic analysis; full-wave CAD model; multiport circuit model; numerical deembedding; port discontinuities; short-open calibration; Calibration; Computational electromagnetics; Coupling circuits; Electromagnetic analysis; Electromagnetic modeling; Feeds; Microstrip; Moment methods; Multiconductor transmission lines; Passive circuits;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2005.847086
  • Filename
    1427989