DocumentCode :
801831
Title :
Comments on "On deembedding of port discontinuities in full-wave CAD models of multiport circuits" and related comments
Author :
Farina, Marco
Author_Institution :
Dept. of Electron. & Autom.s, Univ. of Ancona, Italy
Volume :
53
Issue :
5
fYear :
2005
fDate :
5/1/2005 12:00:00 AM
Firstpage :
1829
Abstract :
For original article by V. I. Okhmatovski, J. D. Morsey and A. C. Cangellaris see ibid vol.51, no.12, p.2355-65, Dec. 2003.
Keywords :
circuit CAD; coupled circuits; equivalent circuits; multiport networks; waveguide discontinuities; coupled multiport circuits; electromagnetic analysis; full-wave CAD model; multiport circuit model; numerical deembedding; port discontinuities; short-open calibration; Calibration; Computational electromagnetics; Coupling circuits; Electromagnetic analysis; Electromagnetic modeling; Feeds; Microstrip; Moment methods; Multiconductor transmission lines; Passive circuits;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2005.847086
Filename :
1427989
Link To Document :
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