Title :
Current Topics Related to STM and AFM
Author_Institution :
Hiroshima University.
fDate :
3/1/1993 12:00:00 AM
Abstract :
Current topics related to scanning tunneling microscopes (STMs) and atomic force microscopes (AFMs) are reviewed. The first two topics concern recent applications of STMs and AFMs as microscopes with atomic resolution, and recent experiments on atomic and molecular manipulation using STMs. A new multifunctional scanning probe microscope (SPM) system incorporating an AFM/STM is then introduced. Finally, current topics at the last STM international conference (STM´91) are discussed.
Keywords :
Atomic force microscopy; Atomic measurements; Biological materials; Force measurement; Magnetic field measurement; Magnetic force microscopy; Magnetic tunneling; Polymers; Scanning probe microscopy; Thickness measurement;
Journal_Title :
Magnetics in Japan, IEEE Translation Journal on
DOI :
10.1109/TJMJ.1993.4565604
