• DocumentCode
    802240
  • Title

    Current Topics Related to STM and AFM

  • Author

    Morita, S.

  • Author_Institution
    Hiroshima University.
  • Volume
    8
  • Issue
    3
  • fYear
    1993
  • fDate
    3/1/1993 12:00:00 AM
  • Firstpage
    204
  • Lastpage
    211
  • Abstract
    Current topics related to scanning tunneling microscopes (STMs) and atomic force microscopes (AFMs) are reviewed. The first two topics concern recent applications of STMs and AFMs as microscopes with atomic resolution, and recent experiments on atomic and molecular manipulation using STMs. A new multifunctional scanning probe microscope (SPM) system incorporating an AFM/STM is then introduced. Finally, current topics at the last STM international conference (STM´91) are discussed.
  • Keywords
    Atomic force microscopy; Atomic measurements; Biological materials; Force measurement; Magnetic field measurement; Magnetic force microscopy; Magnetic tunneling; Polymers; Scanning probe microscopy; Thickness measurement;
  • fLanguage
    English
  • Journal_Title
    Magnetics in Japan, IEEE Translation Journal on
  • Publisher
    ieee
  • ISSN
    0882-4959
  • Type

    jour

  • DOI
    10.1109/TJMJ.1993.4565604
  • Filename
    4565604
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=802240