Sequential detection technique to measure the shape of short THz pulses in the presence of a large jitter in the trigger signal

Author

Hovenier, J.N. ; van Es, R.W. ; Klaassen, T.O. ; Wenckebach, W.T. ; Klappenberger, F. ; Krätschmer, M. ; Winnerl, S. ; Schomburg, E. ; Knippels, G.M.H. ; van der Meer, A.F.G.

Author_Institution

Dept. of Appl. Phys., Delft Univ. of Technol., Netherlands

Volume

149

Issue

3

fYear

2002

fDate

6/1/2002 12:00:00 AM

Firstpage

99

Lastpage

104

Abstract

The possibilities and restrictions for the use of the simple experimental method differential electronic gating (DEG)-developed to determine the shape of repetitive subnanosecond THz pulses in the presence of a large jitter in the trigger signal are investigated. This method, a modification of the recently reported differential optical gating method, is based on subpicosecond electronic gating employing a high frequency sequential oscilloscope. As the ultimate test, the shape of 10 ps FWHM THz pulses from the free electron laser FELIX has been measured

Keywords

free electron lasers; high-speed optical techniques; laser variables measurement; submillimetre wave measurement; timing jitter; 10 ps; differential electronic gating; differential optical gating method; free electron laser FELIX; high frequency sequential oscilloscope; large jitter; repetitive subnanosecond THz pulses; sequential detection technique; short THz pulse shape measurement; subpicosecond electronic gating; trigger signal;

fLanguage

English

Journal_Title

Optoelectronics, IEE Proceedings -

Publisher

iet

ISSN

1350-2433

Type

jour

DOI

10.1049/ip-opt:20020260

Filename

1025926