Title :
High-speed electrooptic modulator characterization using optical spectrum analysis
Author :
Shi, Yongqiang ; Yan, Lianshan ; Willner, Alan Eli
Author_Institution :
Gen. Photonics Corp., Chino, CA, USA
Abstract :
This paper presents our latest studies on high-speed electrooptic modulator characterization using the optical spectrum analysis method. Several new characterization techniques are theoretically analyzed and experimentally demonstrated for the measurement of critical device parameters at very high modulation frequencies. Applying this method in our wide-band electrooptic (EO) modulator characterization experiment, we have successfully measured halfwave voltages, frequency responses, and the chirp parameter at frequencies over 10 GHz for several typical high-speed LiNbO3 modulators. Our experiment showed that the optical spectrum analysis provides an accurate and convenient platform for ultra-high-speed EO modulator characterization.
Keywords :
electro-optical modulation; integrated optics; lithium compounds; optical communication equipment; optical materials; spectral analysis; LiNbO3; chirp parameter; critical device parameters; frequency responses; halfwave voltages; high-speed electrooptic modulator; optical spectrum analysis; very high modulation frequencies; wide-band electrooptic modulator characterization; Chirp modulation; Electrooptic modulators; Fiber nonlinear optics; Frequency measurement; High speed optical techniques; Nonlinear optics; Optical modulation; Optical sensors; Optical transmitters; Voltage;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2003.818162
