High-speed electrooptic modulator characterization using optical spectrum analysis

Author

Shi, Yongqiang ; Yan, Lianshan ; Willner, Alan Eli

Author_Institution

Gen. Photonics Corp., Chino, CA, USA

Volume

21

Issue

10

fYear

2003

Firstpage

2358

Lastpage

2367

Abstract

This paper presents our latest studies on high-speed electrooptic modulator characterization using the optical spectrum analysis method. Several new characterization techniques are theoretically analyzed and experimentally demonstrated for the measurement of critical device parameters at very high modulation frequencies. Applying this method in our wide-band electrooptic (EO) modulator characterization experiment, we have successfully measured halfwave voltages, frequency responses, and the chirp parameter at frequencies over 10 GHz for several typical high-speed LiNbO₃ modulators. Our experiment showed that the optical spectrum analysis provides an accurate and convenient platform for ultra-high-speed EO modulator characterization.

Keywords

electro-optical modulation; integrated optics; lithium compounds; optical communication equipment; optical materials; spectral analysis; LiNbO₃; chirp parameter; critical device parameters; frequency responses; halfwave voltages; high-speed electrooptic modulator; optical spectrum analysis; very high modulation frequencies; wide-band electrooptic modulator characterization; Chirp modulation; Electrooptic modulators; Fiber nonlinear optics; Frequency measurement; High speed optical techniques; Nonlinear optics; Optical modulation; Optical sensors; Optical transmitters; Voltage;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/JLT.2003.818162

Filename

1236508