Title :
Test Engineering for CMOS Gate Arrays with the CAD-System VENUS 1
Author_Institution :
Siemans AG, Munich FRG, Germany.
Abstract :
This paper describes the application of the computer-aided design/computer-aided testing (CAD/CAT) system VENUS 1 at Siemens for testing CMOS gate arrays [1]. The requirements for and the industrial aspects of CMOS gate array testing will be discussed.
Keywords :
Application software; Application specific integrated circuits; CMOS technology; Circuit testing; Design automation; Integrated circuit testing; Manufacturing; Standards development; System testing; Venus;
Journal_Title :
Industrial Electronics, IEEE Transactions on
DOI :
10.1109/TIE.1986.350907
