• DocumentCode
    802608
  • Title

    Accelerated IC test procedure for measuring capacitor ratios using DC extraction techniques

  • Author

    Manku, T. ; Swart, N.R.

  • Author_Institution
    Dept. of Electr. Eng., Tech. Univ. Nova Scotia, Halifax, NS, Canada
  • Volume
    31
  • Issue
    13
  • fYear
    1995
  • fDate
    6/22/1995 12:00:00 AM
  • Firstpage
    1050
  • Lastpage
    1051
  • Abstract
    A technique and associated test structure for measuring IC capacitor ratios are presented. The technique measures these ratios within a time frame of <100 ms. The procedure uses capacitive coupling between the two test capacitors and an MOS transistor. The measurement errors associated with this method are discussed and quantified
  • Keywords
    capacitance measurement; capacitors; integrated circuit testing; life testing; measurement errors; 100 ms; DC extraction techniques; MOS transistor; accelerated IC test procedure; capacitive coupling; capacitor ratios; measurement errors; test capacitors; test structure; time frame;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19950699
  • Filename
    392683
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=802608