DocumentCode
802654
Title
Analysis of Component Failure Problee Using Partially Ordered Sets
Author
Boicourt, G.P.
Author_Institution
Los Alamos Scientific Laboratory, University of California Los Alamos, New Mexico
Volume
18
Issue
4
fYear
1971
Firstpage
247
Lastpage
250
Abstract
It is often desirable, due to expense in time and money, to find the cause of component failures directly from available operational data rather than to resort to controlled tests. Such a method for analyzing component failures cause by manufacturing processing problems is illustrated by an application to a group of early failures among Scyllac capacitors. The application of the method proves that the failures were predominantly caused by inadequate drying of the capacitor packs. The method involves the use of partially ordered sets and can be considered as an abstraction of multivariate regression. The advantages and disadvantages of the method with respect to multivariate regression are discussed.
Keywords
Atomic measurements; Capacitors; Data analysis; Failure analysis; Inspection; Laboratories; Manufacturing processes; Multivariate regression; Performance evaluation; Testing;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1971.4326349
Filename
4326349
Link To Document