• DocumentCode
    802654
  • Title

    Analysis of Component Failure Problee Using Partially Ordered Sets

  • Author

    Boicourt, G.P.

  • Author_Institution
    Los Alamos Scientific Laboratory, University of California Los Alamos, New Mexico
  • Volume
    18
  • Issue
    4
  • fYear
    1971
  • Firstpage
    247
  • Lastpage
    250
  • Abstract
    It is often desirable, due to expense in time and money, to find the cause of component failures directly from available operational data rather than to resort to controlled tests. Such a method for analyzing component failures cause by manufacturing processing problems is illustrated by an application to a group of early failures among Scyllac capacitors. The application of the method proves that the failures were predominantly caused by inadequate drying of the capacitor packs. The method involves the use of partially ordered sets and can be considered as an abstraction of multivariate regression. The advantages and disadvantages of the method with respect to multivariate regression are discussed.
  • Keywords
    Atomic measurements; Capacitors; Data analysis; Failure analysis; Inspection; Laboratories; Manufacturing processes; Multivariate regression; Performance evaluation; Testing;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1971.4326349
  • Filename
    4326349