• DocumentCode
    802695
  • Title

    On error exponents of modulo lattice additive noise channels

  • Author

    Liu, Tie ; Moulin, Pierre ; Koetter, Ralf

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Illinois, Urbana, IL, USA
  • Volume
    52
  • Issue
    2
  • fYear
    2006
  • Firstpage
    454
  • Lastpage
    471
  • Abstract
    Modulo lattice additive noise (MLAN) channels appear in the analysis of structured binning codes for Costa´s dirty-paper channel and of nested lattice codes for the additive white Gaussian noise (AWGN) channel. In this paper, we derive a new lower bound on the error exponents of the MLAN channel. With a proper choice of the shaping lattice and the scaling parameter, the new lower bound coincides with the random-coding lower bound on the error exponents of the AWGN channel at the same signal-to-noise ratio (SNR) in the sphere-packing and straight-line regions. This result implies that, at least for rates close to channel capacity, 1) writing on dirty paper is as reliable as writing on clean paper; and 2) lattice encoding and decoding suffer no loss of error exponents relative to the optimal codes (with maximum-likelihood decoding) for the AWGN channel.
  • Keywords
    AWGN channels; channel capacity; channel coding; error analysis; exponential distribution; random codes; AWGN channel; Costa dirty-paper channel; MLAN channel; additive white Gaussian noise; channel capacity; error exponent; modulo lattice additive noise; nested lattice code; optimal code; random-coding; scaling parameter; sphere-packing; structured binning code; AWGN channels; Additive noise; Additive white noise; Channel capacity; Gaussian noise; Interference constraints; Lattices; Maximum likelihood decoding; Transmitters; Writing; Additive white Gaussian noise (AWGN) channel; Costa´s dirty-paper channel; error exponents; lattice decoding; modulo lattice additive noise (MLAN) channel; nested lattice codes;
  • fLanguage
    English
  • Journal_Title
    Information Theory, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9448
  • Type

    jour

  • DOI
    10.1109/TIT.2005.862077
  • Filename
    1580789