DocumentCode
802703
Title
Error exponents for AR order testing
Author
Boucheron, Stéphane ; Gassiat, Elisabeth
Author_Institution
Lab. de Probabilites et Modeles Aleatoires, Univ. Paris VII-Denis Diderot, France
Volume
52
Issue
2
fYear
2006
Firstpage
472
Lastpage
488
Abstract
This paper is concerned with error exponents in testing problems raised by autoregressive (AR) modeling. The tests to be considered are variants of generalized likelihood ratio testing corresponding to traditional approaches to autoregressive moving-average (ARMA) modeling estimation. In several related problems, such as Markov order or hidden Markov model order estimation, optimal error exponents have been determined thanks to large deviations theory. AR order testing is specially challenging since the natural tests rely on quadratic forms of Gaussian processes. In sharp contrast with empirical measures of Markov chains, the large deviation principles (LDPs) satisfied by Gaussian quadratic forms do not always admit an information-theoretic representation. Despite this impediment, we prove the existence of nontrivial error exponents for Gaussian AR order testing. And furthermore, we exhibit situations where the exponents are optimal. These results are obtained by showing that the log-likelihood process indexed by AR models of a given order satisfy an LDP upper bound with a weakened information-theoretic representation.
Keywords
Gaussian processes; Markov processes; autoregressive moving average processes; error analysis; exponential distribution; information theory; maximum likelihood estimation; ARMA order testing; Gaussian quadratic form; LDP; Markov chain; autoregressive moving-average modeling; error exponent; generalized likelihood ratio testing; large deviation principle; log-likelihood process; Estimation error; Extraterrestrial measurements; Filtration; Gaussian processes; Hidden Markov models; Impedance; Mathematics; Probability distribution; Testing; Upper bound; Error exponents; Gaussian processes; Levinson–Durbin; large deviations; order; test; time series;
fLanguage
English
Journal_Title
Information Theory, IEEE Transactions on
Publisher
ieee
ISSN
0018-9448
Type
jour
DOI
10.1109/TIT.2005.862078
Filename
1580790
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