DocumentCode :
802833
Title :
Analysis of Ti:LiNbO3 waveguides using secondary ion mass spectrometry and near field method
Author :
Caccavale, F. ; Gonella, F. ; Quaranta, A. ; Mansour, I.
Author_Institution :
Dipartimento di Fisica, Padova Univ., Italy
Volume :
31
Issue :
13
fYear :
1995
fDate :
6/22/1995 12:00:00 AM
Firstpage :
1054
Lastpage :
1056
Abstract :
Secondary ion mass spectrometry and the propagating-mode near-field method have been used to determine the Ti concentration and refractive index profiles, respectively, of Ti:LiNbO3 channel waveguides. The nonlinear relationship between index change and dopant concentration is determined
Keywords :
chemical variables measurement; lithium compounds; optical testing; optical waveguides; refractive index measurement; secondary ion mass spectroscopy; titanium; LiNbO3:Ti; Ti concentration; Ti:LiNbO3 waveguides; dopant concentration; index change; near field method; nonlinear relationship; propagating-mode near-field method; refractive index profiles; secondary ion mass spectrometry;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19950732
Filename :
392704
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=802833
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