DocumentCode :
803243
Title :
Accuracy of nonoscillating one-port noise measurements
Author :
Pantoja, Jose Miguel Miranda ; Grüb, Andreas ; Krozer, Viktor ; Franco, Jose Luis Sebastian
Author_Institution :
Dept. de Fisica Aplicada III, Univ. Complutense de Madrid, Spain
Volume :
44
Issue :
4
fYear :
1995
fDate :
8/1/1995 12:00:00 AM
Firstpage :
853
Lastpage :
859
Abstract :
This paper presents a detailed analysis of the accuracy of nonoscillating one-port device noise measurements. A new expression is given for the calculation of the noise temperature from parameters that can be measured directly by using either a power sensor or a noise meter with the capability of making power measurements. A general expression for the DUT noise temperature error function is also obtained, which enables the authors to study how the noise measurement accuracy is affected by a number of different factors. This expression has been found very useful in order to study how the accuracy can be improved in a given noise measurement system. The error function has been applied to evaluate the uncertainty of Schottky barrier device noise measurements
Keywords :
Schottky diode mixers; Schottky diodes; electric noise measurement; electric variables measurement; noise measurement; semiconductor device noise; semiconductor device testing; DUT noise temperature error function; Schottky barrier device; noise temperature; nonoscillating one-port noise measurement; power measurement; power sensor; Acoustical engineering; Calibration; Equations; Genetic expression; Integrated circuit measurements; Modems; Noise measurement; Power measurement; Schottky barriers; Temperature sensors;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.392870
Filename :
392870
Link To Document :
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