DocumentCode
803297
Title
Capacitive sensor arrays in dimensional analysis of surfaces
Author
Nerino, Roberto
Author_Institution
Istituto Elettrotecnico Nazionale Galileo Ferraris, Torino, Italy
Volume
44
Issue
4
fYear
1995
fDate
8/1/1995 12:00:00 AM
Firstpage
875
Lastpage
880
Abstract
The theoretical aspects of dimensional analysis and shape reconstruction of surfaces by means of displacement sensor arrays are investigated. Although this analysis is focused on surface profiles and linear arrays of capacitive sensors, its results could be easily extended to surfaces and bidimensional arrays of displacement sensors. Capacitance variations related to sensor-to-surface displacements during array scanning are used in the reconstruction equations obtained from the analysis. The reconstruction accuracy depends mainly on the dimensional stability of the array, and it is independent from the array trajectory. The problems raised by nonideal array and sensor behavior, such as fringe effects and geometry deviations are discussed. Capacitance variations due to such effects are calculated and taken into account by means of an energy method. A reconstruction system based on the theoretical results is proposed, and its performance in the reconstruction process is evaluated by a computer simulation which accounts for measurement uncertainties. Simulation results confirm both the effectiveness of the method and the feasibility of the system. Its features are compared with those of other noncontact surface-measuring instruments, and possible applications are outlined
Keywords
capacitance measurement; digital simulation; electric sensing devices; shape measurement; signal reconstruction; surface topography measurement; array scanning; bidimensional arrays; capacitance variations; capacitive sensor arrays; computer simulation; dimensional analysis; dimensional stability; displacement sensor arrays; displacement sensors; fringe effects; geometry deviations; linear arrays; measurement uncertainties; noncontact surface-measuring instruments; reconstruction; reconstruction equations; sensor-to-surface displacement; shape reconstruction; surface profiles; Capacitance; Capacitive sensors; Computer simulation; Equations; Geometry; Measurement uncertainty; Sensor arrays; Shape; Stability; Surface reconstruction;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.392874
Filename
392874
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