• DocumentCode
    803297
  • Title

    Capacitive sensor arrays in dimensional analysis of surfaces

  • Author

    Nerino, Roberto

  • Author_Institution
    Istituto Elettrotecnico Nazionale Galileo Ferraris, Torino, Italy
  • Volume
    44
  • Issue
    4
  • fYear
    1995
  • fDate
    8/1/1995 12:00:00 AM
  • Firstpage
    875
  • Lastpage
    880
  • Abstract
    The theoretical aspects of dimensional analysis and shape reconstruction of surfaces by means of displacement sensor arrays are investigated. Although this analysis is focused on surface profiles and linear arrays of capacitive sensors, its results could be easily extended to surfaces and bidimensional arrays of displacement sensors. Capacitance variations related to sensor-to-surface displacements during array scanning are used in the reconstruction equations obtained from the analysis. The reconstruction accuracy depends mainly on the dimensional stability of the array, and it is independent from the array trajectory. The problems raised by nonideal array and sensor behavior, such as fringe effects and geometry deviations are discussed. Capacitance variations due to such effects are calculated and taken into account by means of an energy method. A reconstruction system based on the theoretical results is proposed, and its performance in the reconstruction process is evaluated by a computer simulation which accounts for measurement uncertainties. Simulation results confirm both the effectiveness of the method and the feasibility of the system. Its features are compared with those of other noncontact surface-measuring instruments, and possible applications are outlined
  • Keywords
    capacitance measurement; digital simulation; electric sensing devices; shape measurement; signal reconstruction; surface topography measurement; array scanning; bidimensional arrays; capacitance variations; capacitive sensor arrays; computer simulation; dimensional analysis; dimensional stability; displacement sensor arrays; displacement sensors; fringe effects; geometry deviations; linear arrays; measurement uncertainties; noncontact surface-measuring instruments; reconstruction; reconstruction equations; sensor-to-surface displacement; shape reconstruction; surface profiles; Capacitance; Capacitive sensors; Computer simulation; Equations; Geometry; Measurement uncertainty; Sensor arrays; Shape; Stability; Surface reconstruction;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.392874
  • Filename
    392874