Title :
Binary versus decade inductive voltage divider comparison and error decomposition
Author :
Avramov-Zamurovic, Svetlana ; Stenbakken, Gerard N. ; Koffman, Andrew D. ; Oldham, Nile M. ; Gammon, Robert W.
Author_Institution :
US Naval Acad., Annapolis, MD, USA
fDate :
8/1/1995 12:00:00 AM
Abstract :
An automatic inductive voltage divider (IVD) characterization method that can measure linearity by comparing IVD´s with different structures is suggested. Structural models are employed to decompose an error vector into components that represent each divider. Initial tests at 400 Hz show that it is possible to assign independent errors due to the binary and decade structures with a 2σ uncertainty of 0.05 parts per million (ppm) at the measured ratio values
Keywords :
automatic test equipment; autotransformers; bridge circuits; error analysis; 400 Hz; automatic bridge; automatic calibration; autotransformer; binary structures; decade representation; decade structures; error decomposition; error vector; inductive voltage divider; linearity; measured ratio values; structural models; uncertainty; Helium; Impedance; Linearity; Matrix decomposition; Noise measurement; Senior members; Testing; Transformers; Vectors; Voltage;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
