• DocumentCode
    803414
  • Title

    2006 IEEE International Electron Devices Meeting

  • Volume
    6
  • Issue
    3
  • fYear
    2006
  • Firstpage
    496
  • Lastpage
    496
  • Abstract
    Provides notice of upcoming conference events of interest to practitioners and researchers.
  • fLanguage
    English
  • Journal_Title
    Device and Materials Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2006.886764
  • Filename
    1717502
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=803414