Title : 
The role of baseband noise and its upconversion in HBT oscillator phase noise
         
        
            Author : 
Tutt, Marcel N. ; Pavlidis, Dimitris ; Khatibzadeh, Ali ; Bayraktaroglu, Burhan
         
        
            Author_Institution : 
Corp. Res. & Dev. Lab., Texas Instrum. Inc., Dallas, TX, USA
         
        
        
        
        
            fDate : 
7/1/1995 12:00:00 AM
         
        
        
        
            Abstract : 
The phase noise spectral density (£(fm)) of an 11.02-GHz heterojunction bipolar transistor (HBT) dielectric resonator oscillator (DRO) has been investigated in terms of the HBT´s low frequency noise and the oscillator´s upconversion coefficient. Experimental studies have been used for this purpose and the measured £(fm) ranged from -89 dBc/Hz to -101 dBc/Hz at a 10-kHz offset frequency (best phase noise spectral density performance was -124 dBc/Hz at 100 kHz). It was shown that, in most test cases, £(fm) can be described by the upconversion of the HBT´s baseband noise. As a result the frequency dependence, of £(fm ), is dictated by the low frequency noise spectrum rather than the upconversion itself. Deviation from pure 1/f frequency dependence found for the HBT´s baseband noise at frequencies above 100 Hz resulted in d£(fm)/d(fm) deviating from about -30-dB/decade rate. Reduced oscillator phase noise at high collector current is attributed to reduced upconversion in the oscillator
         
        
            Keywords : 
bipolar transistor circuits; dielectric resonator oscillators; heterojunction bipolar transistors; microwave oscillators; phase noise; semiconductor device noise; 11.02 GHz; HBT oscillator; baseband noise; dielectric resonator oscillator; heterojunction bipolar transistor; low frequency noise; phase noise spectral density; upconversion coefficient; Baseband; Density measurement; Dielectric measurements; Frequency dependence; Frequency measurement; Heterojunction bipolar transistors; Low-frequency noise; Noise measurement; Oscillators; Phase noise;
         
        
        
            Journal_Title : 
Microwave Theory and Techniques, IEEE Transactions on